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Handbook of X-ray Astronomy - - Bog - Cambridge University Press - Plusbog.dk

Modern Diagnostic X-Ray Sources - Rolf Behling - Bog - Taylor & Francis Ltd - Plusbog.dk

Modern Diagnostic X-Ray Sources - Rolf Behling - Bog - Taylor & Francis Ltd - Plusbog.dk

Now fully updated, the second edition of Modern Diagnostic X-Ray Sources: Technology, Manufacturing, Reliability gives an up-to-date summary of X-ray source technology and design for applications in modern diagnostic medical imaging. It lays a sound groundwork for education and advanced training in the physics of X-ray production, X-ray interactions with matter, and imaging modalities and assesses their prospects. The book begins with a comprehensive and easy-to-read historical overview of X-ray tube and generator development, including key achievements leading up to the current technological and economic state of the field. The book covers the physics of X-ray generation, including the process of constructing X-ray source devices. The stand-alone chapters can be read in order or in selections. They take you inside diagnostic X-ray tubes, illustrating their design, functions, metrics for validation, and interfaces. The detailed descriptions enable objective comparison and benchmarking. This detailed presentation of X-ray tube creation and functions enables you to understand how to optimize tube efficiency, particularly with consideration for economics and environmental care. It also simplifies faultfinding. Along with covering the past and current state of the field, the book assesses the future regarding developing new X-ray sources that can enhance performance and yield greater benefits to the scientific community and to the public. After heading international R&D, marketing and advanced development for X-ray sources with Philips, and working in the X-ray industry for more than four decades, Rolf Behling retired in 2020 and is now the owner of the consulting firm XtraininX, Germany. He holds numerous patents and is continuously publishing, consulting and training.

DKK 684.00
1

Computer Vision for X-Ray Testing - Domingo Mery - Bog - Springer Nature Switzerland AG - Plusbog.dk

Semiconductor X-Ray Detectors - B. G. Lowe - Bog - Taylor & Francis Ltd - Plusbog.dk

Semiconductor X-Ray Detectors - B. G. Lowe - Bog - Taylor & Francis Ltd - Plusbog.dk

Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SDDs), Charge Coupled Devices (CCDs), and Compound Semiconductor Detectors, including renewed interest in alternative materials such as CdZnTe and diamond, has made the Si(Li) X-Ray Detector nearly obsolete, the device serves as a useful benchmark and still is used in special instances where its large, sensitive depth is essential. Semiconductor X-Ray Detectors focuses on the history and development of Si(Li) X-Ray Detectors, an important supplement to the knowledge now required to achieve full understanding of the workings of SDDs, CCDs, and Compound Semiconductor Detectors. The book provides an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters present a self-contained summary of relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the assembly and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.

DKK 680.00
1

X-Ray Diffraction Imaging - - Bog - Taylor & Francis Ltd - Plusbog.dk

X-Ray Structure Analysis of Bio-Macromolecular Crystals - Kumasaka - Bog - Oxford University Press - Plusbog.dk

X-Ray Structure Analysis of Bio-Macromolecular Crystals - Kumasaka - Bog - Oxford University Press - Plusbog.dk

Since the late 19th century, X-ray structural studies have forged ahead through technological progress and the creative ingenuity of researchers. As high intensity X-ray sources and increased speed and sensitivity of the detectors have emerged, it''s now possible to image the atomic structure of complex bio-macromolecules, the orbital electron density of small molecules, and to even follow the dynamical behavior of bio-macromolecules. Textbooks from which junior researchers can grasp the current art have not kept pace with the technological developments and diversification of the field. X-ray studies of bio-macromolecules require a broad understanding of the theory and practical methodologies. A project can include isolating, crystalizing, and adjudicating suitable samples, obtaining and analysing the X-ray data, and finally publishing the results in a standard format. Early decisions in a project can become pitfalls that swallow the unwary. It is increasingly essential to become adept at managing both proteins and nucleic acids. Whereas software is available to help in the critical problem of resolving the phase, expedience often encourages treating such tools as a black-box. The aim here is to help navigate the researcher through these multifarious issues. The book is intended to serve as a "companion" to experimentalists. It is divided into a general overview of X-ray structural analysis techniques (chapters 1-2) and a detailed discussion (chapters 3-16) that begins with the preparation of proteins and (uniquely) nucleic acids and ends with publishing the results and is organized to lead the reader through the whole process.

DKK 416.00
1

Advanced X-Ray Radiation Detection: - - Bog - Springer Nature Switzerland AG - Plusbog.dk

Airport Passenger Screening Using Backscatter X-Ray Machines - National Materials And Manufacturing Board - Bog - National Academies Press -

Airport Passenger Screening Using Backscatter X-Ray Machines - National Materials And Manufacturing Board - Bog - National Academies Press -

Passenger screening at commercial airports in the United States has gone through significant changes since the events of September 11, 2001. In response to increased concern over terrorist attacks on aircrafts, the Transportation Security Administration (TSA) has deployed security systems of advanced imaging technology (AIT) to screen passengers at airports. To date (December 2014), TSA has deployed AITs in U.S. airports of two different technologies that use different types of radiation to detect threats: millimeter wave and X-ray backscatter AIT systems. X-ray backscatter AITs were deployed in U.S. airports in 2008 and subsequently removed from all airports by June 2013 due to privacy concerns. TSA is looking to deploy a second-generation X-ray backscatter AIT equipped with privacy software to eliminate production of an image of the person being screened in order to alleviate these concerns. This report reviews previous studies as well as current processes used by the Department of Homeland Security and equipment manufacturers to estimate radiation exposures resulting from backscatter X-ray advanced imaging technology system use in screening air travelers. Airport Passenger Screening Using Backscatter X-Ray Machines examines whether exposures comply with applicable health and safety standards for public and occupational exposures to ionizing radiation and whether system design, operating procedures, and maintenance procedures are appropriate to prevent over exposures of travelers and operators to ionizing radiation. This study aims to address concerns about exposure to radiation from X-ray backscatter AITs raised by Congress, individuals within the scientific community, and others. Table of ContentsFront MatterSummary1 Introduction2 Radiation Physics Relevant to Advanced Imaging Technology3 X-Ray Backscatter Advanced Imaging Technology4 Dosimetry for X-Ray Backscatter Advanced Imaging Technology5 Radiation Protection Standards6 Review of X-Ray Backscatter Advanced Imaging Technology Studies7 Measurements, Dose Calculations, and System Design for X-Ray Backscatter Advanced Imaging Technology SystemsAppendixesAppendix A: Statement of TaskAppendix B: Glossary, Acronyms, and AbbreviationsAppendix C: Organ Absorbed DosesAppendix D: Summary of Statistics from Previous StudiesAppendix E: Biographies of Committee Members and Contractors

DKK 422.00
1

Calculating X-ray Tube Spectra - Pedro Andreo - Bog - Taylor & Francis Ltd - Plusbog.dk

Advanced X-ray Detector Technologies - - Bog - Springer Nature Switzerland AG - Plusbog.dk

Advanced X-ray Detector Technologies - - Bog - Springer Nature Switzerland AG - Plusbog.dk

X-Ray Imaging Systems for Biomedical Engineering Technology - Euclid Seeram - Bog - Springer International Publishing AG - Plusbog.dk

Exploring the X-ray Universe - Frederick D. (harvard Smithsonian Center For Astrophysics) Seward - Bog - Cambridge University Press - Plusbog.dk

High Resolution X-Ray Diffractometry And Topography - D.k. Bowen - Bog - Taylor & Francis Ltd - Plusbog.dk