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Handbook of X-ray Astronomy - - Bog - Cambridge University Press - Plusbog.dk

Coherent X-Ray Optics - David Paganin - Bog - Oxford University Press - Plusbog.dk

Modern Diagnostic X-Ray Sources - Rolf Behling - Bog - Taylor & Francis Ltd - Plusbog.dk

Modern Diagnostic X-Ray Sources - Rolf Behling - Bog - Taylor & Francis Ltd - Plusbog.dk

Now fully updated, the second edition of Modern Diagnostic X-Ray Sources: Technology, Manufacturing, Reliability gives an up-to-date summary of X-ray source technology and design for applications in modern diagnostic medical imaging. It lays a sound groundwork for education and advanced training in the physics of X-ray production, X-ray interactions with matter, and imaging modalities and assesses their prospects. The book begins with a comprehensive and easy-to-read historical overview of X-ray tube and generator development, including key achievements leading up to the current technological and economic state of the field. The book covers the physics of X-ray generation, including the process of constructing X-ray source devices. The stand-alone chapters can be read in order or in selections. They take you inside diagnostic X-ray tubes, illustrating their design, functions, metrics for validation, and interfaces. The detailed descriptions enable objective comparison and benchmarking. This detailed presentation of X-ray tube creation and functions enables you to understand how to optimize tube efficiency, particularly with consideration for economics and environmental care. It also simplifies faultfinding. Along with covering the past and current state of the field, the book assesses the future regarding developing new X-ray sources that can enhance performance and yield greater benefits to the scientific community and to the public. After heading international R&D, marketing and advanced development for X-ray sources with Philips, and working in the X-ray industry for more than four decades, Rolf Behling retired in 2020 and is now the owner of the consulting firm XtraininX, Germany. He holds numerous patents and is continuously publishing, consulting and training.

DKK 684.00
1

Computer Vision for X-Ray Testing - Domingo Mery - Bog - Springer Nature Switzerland AG - Plusbog.dk

Photon Counting Detectors for X-ray Imaging - Takumi Asakawa - Bog - Springer Nature Switzerland AG - Plusbog.dk

Semiconductor X-Ray Detectors - B. G. Lowe - Bog - Taylor & Francis Ltd - Plusbog.dk

Semiconductor X-Ray Detectors - B. G. Lowe - Bog - Taylor & Francis Ltd - Plusbog.dk

Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SDDs), Charge Coupled Devices (CCDs), and Compound Semiconductor Detectors, including renewed interest in alternative materials such as CdZnTe and diamond, has made the Si(Li) X-Ray Detector nearly obsolete, the device serves as a useful benchmark and still is used in special instances where its large, sensitive depth is essential. Semiconductor X-Ray Detectors focuses on the history and development of Si(Li) X-Ray Detectors, an important supplement to the knowledge now required to achieve full understanding of the workings of SDDs, CCDs, and Compound Semiconductor Detectors. The book provides an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters present a self-contained summary of relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the assembly and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.

DKK 680.00
1

X-Ray Diffraction Imaging - - Bog - Taylor & Francis Ltd - Plusbog.dk

X-Ray Structure Analysis of Bio-Macromolecular Crystals - Kumasaka - Bog - Oxford University Press - Plusbog.dk

X-Ray Structure Analysis of Bio-Macromolecular Crystals - Kumasaka - Bog - Oxford University Press - Plusbog.dk

Since the late 19th century, X-ray structural studies have forged ahead through technological progress and the creative ingenuity of researchers. As high intensity X-ray sources and increased speed and sensitivity of the detectors have emerged, it''s now possible to image the atomic structure of complex bio-macromolecules, the orbital electron density of small molecules, and to even follow the dynamical behavior of bio-macromolecules. Textbooks from which junior researchers can grasp the current art have not kept pace with the technological developments and diversification of the field. X-ray studies of bio-macromolecules require a broad understanding of the theory and practical methodologies. A project can include isolating, crystalizing, and adjudicating suitable samples, obtaining and analysing the X-ray data, and finally publishing the results in a standard format. Early decisions in a project can become pitfalls that swallow the unwary. It is increasingly essential to become adept at managing both proteins and nucleic acids. Whereas software is available to help in the critical problem of resolving the phase, expedience often encourages treating such tools as a black-box. The aim here is to help navigate the researcher through these multifarious issues. The book is intended to serve as a "companion" to experimentalists. It is divided into a general overview of X-ray structural analysis techniques (chapters 1-2) and a detailed discussion (chapters 3-16) that begins with the preparation of proteins and (uniquely) nucleic acids and ends with publishing the results and is organized to lead the reader through the whole process.

DKK 416.00
1

X-Ray Diffraction for Materials Research - Myeongkyu Lee - Bog - Apple Academic Press Inc. - Plusbog.dk

X-Ray Diffraction for Materials Research - Myeongkyu Lee - Bog - Apple Academic Press Inc. - Plusbog.dk

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

DKK 819.00
1

Chest X-ray Made Easy - Deepa Chegu - Bog - Jaypee Brothers Medical Publishers - Plusbog.dk

Interpretation of Chest X-Ray - G Balachandran - Bog - Jaypee Brothers Medical Publishers - Plusbog.dk

Advanced X-Ray Radiation Detection: - - Bog - Springer Nature Switzerland AG - Plusbog.dk